Muhammad Farhan T. is an R&D Electronics Engineer at Valeo Germany, specializing in power semiconductors for e-automotive traction inverters. His expertise covers Silicon and Wide-Bandgap (SiC/GaN) semiconductors, simulations, and reliability testing. He holds a Master of Science from Technische Universität Ilmenau and has a background in industrial automation and IoT hardware.
He has co-authored and presented research on the reliability and thermal modeling of Gallium Nitride (GaN) power transistors at international IEEE conferences.
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